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Derniers dépôts
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Jean-Pierre Landesman, Juan Jimenez, Christophe Levallois, Frédéric Pommereau, Cesare Frigeri, et al.. Defect formation during chlorine-based dry etching and their effects on the electronic and structural properties of InP/InAsP quantum wells. Journal of Vacuum Science & Technology A, 2016, 34 (4), pp.041304. ⟨10.1116/1.4950445⟩. ⟨hal-01372796⟩
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