D. G. Coates, Kikuchi-like reflection patterns obtained with the scanning electron microscope, Philos. Mag, vol.16, pp.1179-1184, 1967.

G. R. Booker, A. M. Shaw, M. J. Whelan, and P. B. Hirsch, Some comments on the interpretation of the 'kikuchi-like reflection patterns' observed by scanning electron microscopy, Philos. Mag, vol.16, pp.1185-1191, 1967.

G. E. Lloyd, Atomic number and crystallographic contrast images with the SEM: a review of backscattered electron techniques, Mineral. Mag, vol.51, pp.3-19, 1987.

R. Vincent and P. A. Midgley, Double conical beam-rocking system for measurement of integrated electron diffraction intensities, Ultramicroscopy, vol.53, pp.271-282, 1994.

, ELCRYST 2005: new frontiers in electron crystallography, vol.107, pp.431-558, 2005.

C. S. Own, W. Sinkler, and L. D. Marks, Rapid structure determination of a metal oxide from pseudo-kinematical electron diffraction data, Ultramicroscopy, vol.106, pp.114-122, 2006.

C. G. Van-essen and E. M. Schulson, Selected area channelling patterns in the scanning electron microscope, J. Mater. Sci, vol.4, pp.336-339, 1969.

C. G. Van-essen, E. M. Schulson, and R. H. Donaghay, Electron channelling patterns from small (10 [micro]m) selected areas in the scanning electron microscope, Nature, vol.225, pp.847-848, 1970.

D. C. Joy and G. R. Booker, Simultaneous display of micrograph and selected-area channelling pattern using the scanning electron microscope, J. Phys. E: Sci. Instrum, vol.4, p.837, 1971.

D. C. Joy, D. E. Newbury, and D. L. Davidson, Electron channeling patterns in the scanning electron microscope, J. Appl. Phys, vol.53, pp.81-122, 1982.

J. Dluho?, L. Sedlá?ek, and J. Man, Proceedings of the 21st International Conference on Metallurgy and Materials, 2012.

J. A. Venables and C. J. Harland, Electron back-scattering patterns-a new technique for obtaining crystallographic information in the scanning electron microscope, Philos. Mag, vol.27, pp.1193-1200, 1973.

S. I. Wright and B. L. Adams, Automatic analysis of electron backscatter diffraction patterns, Metall. Trans. A, vol.23, pp.759-767, 1992.

A. J. Wilkinson and P. B. Hirsch, Electron diffraction based techniques in scanning electron microscopy of bulk materials, Micron, vol.28, pp.279-308, 1997.

S. I. Wright, M. M. Nowell, and D. P. Field, A review of strain analysis using electron backscatter diffraction, Microsc. Microanal, vol.17, pp.316-329, 2011.

T. Maitland and S. Sitzman, Backscattering detector and EBSD in nanomaterials characterization, Scanning Microscopy for Nanotechnology, pp.41-75, 2007.

M. A. Crimp, Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast, Microsc. Res. Tech, vol.69, pp.374-381, 2006.

A. Weidner, F. Pyczak, and H. Biermann, Scanning and transmission electron microscopy investigations of defect arrangements in a two-phase ?-TiAl alloy, Mater. Sci. Eng.: A, vol.571, pp.49-56, 2013.

A. Barnoush, Correlation between dislocation density and nanomechanical response during nanoindentation, Acta Mater, vol.60, pp.1268-1277, 2012.

S. Primig, H. Leitner, W. Knabl, A. Lorich, and H. Clemensr, Stickler, Influence of the heating rate on the recrystallization behavior of molybdenum, Mater. Sci. Eng.: A, vol.535, pp.316-324, 2012.

J. Ahmed, S. G. Roberts, and A. J. Wilkinson, Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging, Philos. Mag, vol.86, pp.4965-4981, 2006.

Y. N. Picard, R. Kamaladasa, M. De-graef, N. T. Nuhfer, W. J. Mershon et al., Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling, vol.20, pp.12-16, 2012.

J. K. Hite, M. A. Mastro, and C. R. Eddy, Approach for dislocation free GaN epitaxy, J. Cryst. Growth, vol.312, pp.3143-3146, 2010.

G. Naresh-kumar, B. Hourahine, P. R. Edwards, A. P. Day, A. Winkelmann et al., Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope, Phys. Rev. Lett, vol.108, p.135503, 2012.

N. Ferralis, J. Kawasaki, R. Maboudian, and C. Carraro, Evolution in surface morphology of epitaxial graphene layers on SiC induced by controlled structural strain, Appl. Phys. Lett, vol.93, p.191916, 2008.

I. Gutierrez-urrutia, S. Zaefferer, and D. Raabe, Electron channeling contrast imaging of twins and dislocations in twinning-induced plasticity steels under controlled diffraction conditions in a scanning electron microscope, Scr. Mater, vol.61, pp.737-740, 2009.

S. Zaefferer and N. Elhami, Theory and application of electron channelling contrast imaging under controlled diffraction conditions, Acta Mater, vol.75, pp.20-50, 2014.

F. J. Humphreys, Review Grain and subgrain characterisation by electron backscatter diffraction, J. Mater. Sci, vol.36, pp.3833-3854, 2001.

F. J. Humphreys, Y. Huang, I. Brough, and C. Harris, Electron backscatter diffraction of grain and subgrain structures-resolution considerations, J. Microsc, vol.195, pp.212-216, 1999.

S. Wright, M. Nowell, and J. Basinger, Precision of EBSD based orientation measurements, Microsc. Microanal, vol.17, pp.406-407, 2011.

S. I. Wright and M. Nowell, High-speed EBSD, Adv. Mater. Process, vol.166, pp.29-31, 2008.

Y. N. Picard, M. E. Twigg, J. D. Caldwell, C. R. Eddy, P. G. Neudeck et al., Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC, Appl. Phys. Lett, vol.90, p.234101, 2007.

R. Kamaladasa, W. Jiang, and Y. Picard, Imaging dislocations in single-crystal SrTiO3 substrates by electron channeling, J. Electron. Mater, vol.40, pp.2222-2227, 2011.

H. Mansour, J. Guyon, M. A. Crimp, N. Gey, B. Beausir et al., Accurate electron channeling contrast analysis of dislocations in fine grained bulk materials, Scr. Mater, pp.11-14, 2014.
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M. G. Hall and G. K. Skinner, A spiral scanning attachment for electron-channelling studies with a scanning electron microscope, J. Phys. E: Sci. Instrum, vol.11, p.1129, 1978.

D. C. Joy and D. E. Newbury, Scanning electron microscope selected area channelling patterns from 1 ?m specimen areas, J. Mater. Sci, vol.7, pp.714-716, 1972.

Y. N. Picard, M. E. Twigg, J. D. Caldwell, C. R. Eddy, M. A. Mastro et al., Resolving the Burgers vector for individual GaN dislocations by electron channeling contrast imaging, Scr. Mater, vol.61, pp.773-776, 2009.