<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-01873816</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-24T13:39:34+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">A novel diode open circuit fault detection in three phase rectifier based on k-means method</title>
            <author role="aut">
              <persName>
                <forename type="first">Mehdi</forename>
                <surname>Rahnama</surname>
              </persName>
              <idno type="halauthorid">1422188-0</idno>
              <affiliation ref="#struct-223521"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Abolfazl</forename>
                <surname>Vahedi</surname>
              </persName>
              <idno type="idhal" notation="numeric">789451</idno>
              <idno type="halauthorid" notation="string">1338150-789451</idno>
              <idno type="IDREF">https://www.idref.fr/070832390</idno>
              <affiliation ref="#struct-223521"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Arta Mohammad</forename>
                <surname>Alikhani</surname>
              </persName>
              <idno type="halauthorid">1422189-0</idno>
              <affiliation ref="#struct-223521"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Noureddine</forename>
                <surname>Takorabet</surname>
              </persName>
              <email type="md5">1ecdd7318c58619b7e03abfc8f89021c</email>
              <email type="domain">univ-lorraine.fr</email>
              <idno type="idhal" notation="string">noureddine-takorabet</idno>
              <idno type="idhal" notation="numeric">13793</idno>
              <idno type="halauthorid" notation="string">2101-13793</idno>
              <idno type="ORCID">https://orcid.org/0000-0001-5664-134X</idno>
              <idno type="IDREF">https://www.idref.fr/07084206X</idno>
              <affiliation ref="#struct-526051"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Babak</forename>
                <surname>Fazelbakhsheshi</surname>
              </persName>
              <idno type="halauthorid">1422190-0</idno>
              <affiliation ref="#struct-542978"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>latifa</forename>
                <surname>zoua</surname>
              </persName>
              <email type="md5">3da1cc763a2b0759c1aa42447f24bd7d</email>
              <email type="domain">univ-lorraine.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2018-09-13 15:59:05</date>
              <date type="whenModified">2023-09-12 14:14:08</date>
              <date type="whenReleased">2018-09-13 15:59:05</date>
              <date type="whenProduced">2018-02-20</date>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="566492">
                <persName>
                  <forename>latifa</forename>
                  <surname>zoua</surname>
                </persName>
                <email type="md5">3da1cc763a2b0759c1aa42447f24bd7d</email>
                <email type="domain">univ-lorraine.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-01873816</idno>
            <idno type="halUri">https://hal.univ-lorraine.fr/hal-01873816</idno>
            <idno type="halBibtex">rahnama:hal-01873816</idno>
            <idno type="halRefHtml">&lt;i&gt;19th IEEE International Conference on Industrial Technology (ICIT)&lt;/i&gt;, Feb 2018, Lyon, France. pp.600-605, &lt;a target="_blank" href="https://dx.doi.org/10.1109/ICIT.2018.8352246"&gt;&amp;#x27E8;10.1109/ICIT.2018.8352246&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">19th IEEE International Conference on Industrial Technology (ICIT), Feb 2018, Lyon, France. pp.600-605, &amp;#x27E8;10.1109/ICIT.2018.8352246&amp;#x27E9;</idno>
            <availability status="restricted"/>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="GREEN">Groupe de Recherche en Energie Electrique de Nancy</idno>
            <idno type="stamp" n="UNIV-LORRAINE">Université de Lorraine</idno>
            <idno type="stamp" n="EMPP-UL">Pôle scientifique Energie, Mécanique, Procédés, Produits de l'Université de Lorraine</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="invited" n="0">No</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
            <note type="proceedings" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">A novel diode open circuit fault detection in three phase rectifier based on k-means method</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Mehdi</forename>
                    <surname>Rahnama</surname>
                  </persName>
                  <idno type="halauthorid">1422188-0</idno>
                  <affiliation ref="#struct-223521"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Abolfazl</forename>
                    <surname>Vahedi</surname>
                  </persName>
                  <idno type="idhal" notation="numeric">789451</idno>
                  <idno type="halauthorid" notation="string">1338150-789451</idno>
                  <idno type="IDREF">https://www.idref.fr/070832390</idno>
                  <affiliation ref="#struct-223521"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Arta Mohammad</forename>
                    <surname>Alikhani</surname>
                  </persName>
                  <idno type="halauthorid">1422189-0</idno>
                  <affiliation ref="#struct-223521"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Noureddine</forename>
                    <surname>Takorabet</surname>
                  </persName>
                  <email type="md5">1ecdd7318c58619b7e03abfc8f89021c</email>
                  <email type="domain">univ-lorraine.fr</email>
                  <idno type="idhal" notation="string">noureddine-takorabet</idno>
                  <idno type="idhal" notation="numeric">13793</idno>
                  <idno type="halauthorid" notation="string">2101-13793</idno>
                  <idno type="ORCID">https://orcid.org/0000-0001-5664-134X</idno>
                  <idno type="IDREF">https://www.idref.fr/07084206X</idno>
                  <affiliation ref="#struct-526051"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Babak</forename>
                    <surname>Fazelbakhsheshi</surname>
                  </persName>
                  <idno type="halauthorid">1422190-0</idno>
                  <affiliation ref="#struct-542978"/>
                </author>
              </analytic>
              <monogr>
                <meeting>
                  <title>19th IEEE International Conference on Industrial Technology (ICIT)</title>
                  <date type="start">2018-02-20</date>
                  <date type="end">2018-02-22</date>
                  <settlement>Lyon</settlement>
                  <country key="FR">France</country>
                </meeting>
                <imprint>
                  <publisher>IEEE</publisher>
                  <biblScope unit="serie">2018 IEEE International Conference on Industrial Technology (ICIT)</biblScope>
                  <biblScope unit="pp">600-605</biblScope>
                  <date type="datePub">2018</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1109/ICIT.2018.8352246</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <classCode scheme="halDomain" n="spi.elec">Engineering Sciences [physics]/Electromagnetism</classCode>
              <classCode scheme="halDomain" n="spi.nrj">Engineering Sciences [physics]/Electric power</classCode>
              <classCode scheme="halTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halOldTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halTreeTypology" n="COMM">Conference papers</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>Precise and accurate fault detection in rectifier diode reduces the time and cost of maintenance and prevents the fault development and more severe faults occurrence. In spite of the importance of open circuit diodes, they are not normally protected in three-phase diode rectifiers for open circuit fault. This is very important in the rectifier of generator systems where voltage control is done based on the output voltage of the rectifier. In this paper, all modes of occurrence of diode open-circuit faults in three-phase rectifiers are categorized and simulated. By using fast Fourier transform analysis, an appropriate feature for fault detection is extracted and k-means algorithm is used to clustering the faults. In order to evaluate the proposed method, the results of the experimental test are classified according to simulation results. In all fault classes, the diagnosis was performed correctly.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="institution" xml:id="struct-223521" status="VALID">
          <idno type="ROR">https://ror.org/01jw2p796</idno>
          <orgName>Iran University of Science and Technology [Tehran]</orgName>
          <orgName type="acronym">IUST</orgName>
          <desc>
            <address>
              <addrLine>Narmak, Tehran, Iran, 1684613114</addrLine>
              <country key="IR"/>
            </address>
            <ref type="url">http://www.iust.ac.ir/home_en.php</ref>
          </desc>
        </org>
        <org type="laboratory" xml:id="struct-526051" status="VALID">
          <idno type="IdRef">073908843</idno>
          <idno type="RNSR">200918457C</idno>
          <idno type="IdUnivLorraine">[UL]RQD--</idno>
          <idno type="ROR">https://ror.org/01kwx4m12</idno>
          <orgName>Groupe de Recherche en Energie Electrique de Nancy</orgName>
          <orgName type="acronym">GREEN</orgName>
          <date type="start">2018-01-01</date>
          <desc>
            <address>
              <addrLine>Site ENSEM : 2 avenue de la Forêt de Haye, TSA 60604, 54518 Vandoeuvre-lès-Nancy Cedex ; Site FST : Faculté des Sciences et Technologies, BP 70239, 54506 Vandoeuvre-lès-Nancy Cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://green.univ-lorraine.fr/</ref>
          </desc>
          <listRelation>
            <relation name="UR4366" active="#struct-413289" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-542978" status="INCOMING">
          <orgName>Montazer Ghaem Power Plant</orgName>
          <desc>
            <address>
              <addrLine>Alborz Province, Karaj, Fardis, Malard Road</addrLine>
              <country key="IR"/>
            </address>
            <ref type="url">http://www.sepedco.com/</ref>
          </desc>
        </org>
        <org type="institution" xml:id="struct-413289" status="VALID">
          <idno type="IdRef">157040569</idno>
          <idno type="IdUnivLorraine">[UL]100--</idno>
          <idno type="ROR">https://ror.org/04vfs2w97</idno>
          <orgName>Université de Lorraine</orgName>
          <orgName type="acronym">UL</orgName>
          <date type="start">2012-01-01</date>
          <desc>
            <address>
              <addrLine>34 cours Léopold - CS 25233 - 54052 Nancy cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.univ-lorraine.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>