Skip to Main content Skip to Navigation

A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter

Complete list of metadatas

https://hal.univ-lorraine.fr/hal-02495999
Contributor : Zhixue Zheng <>
Submitted on : Monday, March 2, 2020 - 4:43:39 PM
Last modification on : Tuesday, March 3, 2020 - 1:36:24 AM

Identifiers

Citation

Z. Li, Z. Zheng, R. Outbib. A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter. Microelectronics Reliability, Elsevier, 2018, 88-90, pp.350-354. ⟨10.1016/j.microrel.2018.07.137⟩. ⟨hal-02495999⟩

Share

Metrics

Record views

26