es of Metals ( Blackie and sons, 1961. ,
Cours de Physique générale : Opti,que ,
Propriétés électroni,ques des métaur et alli,ages (Ecole d'été de Royan, Septembre, vol.7977, 1973. ,
The Dgnamics of Conduction Electrons (Gordon and Breach ,
The theory of the electrical conductivity of liquid metals, Advances in Physics, vol.6, issue.60, pp.547-581, 1966. ,
DOI : 10.1080/14786436108243361
Pri,nci,ples of the theorg of solid, 1972. ,
The Dielectric Constant of Liquid Metals, Phys. Kondens. Materie, vol.5, pp.60-72, 1966. ,
Memory function for the response of conduction electrons in metals, Physical Review B, vol.27, issue.6, pp.2427-2428, 1978. ,
DOI : 10.1515/zna-1972-0306
Electronic structure of metals. VII. Optical absorption of simple metals, Journal of Physics F: Metal Physics, vol.9, issue.3, pp.579-589, 1979. ,
DOI : 10.1088/0305-4608/9/3/019
Reformulation of the model potential theory of simple metals, Ph.D, 1968. ,
Theory of Optical Properties of Liquid metals, Opt. Spekt., bf, vol.35, pp.681-686, 1973. ,
The Optical Properti,es of Soli,ds, 1966. ,
The Ellipsometer, an Apparatus to Measure Thicknesses of Thin Surface Films, Review of Scientific Instruments, vol.16, issue.2, pp.26-30, 1946. ,
DOI : 10.1002/andp.19203682503
Ellipsometry-avaluable tool in surface research, RCA Rev, vol.25, p.85, 1964. ,
Analytical Determination of Optical Constants Based on the Polarized Reflectance at a Dielectric???Conductor Interface*, Journal of the Optical Society of America, vol.54, issue.7, p.904, 1964. ,
DOI : 10.1364/JOSA.54.000904
n the rneasurements of surfaces and thi,n films, 1964. ,
Determination of the Properties of Films on Silicon by the Method of Ellipsometry, Journal of the Optical Society of America, vol.52, issue.9, p.970, 1962. ,
DOI : 10.1364/JOSA.52.000970
Studies of surface, thin film and interface properties by automatic spectroscopic ellipsometry, Journal of Vacuum Science and Technology, vol.18, issue.2, p.289, 1981. ,
DOI : 10.1116/1.570744
Automatic rotating element ellipsometers: Calibration, operation, and real???time applications, Review of Scientific Instruments, vol.78, issue.8, pp.2029-2061, 1990. ,
DOI : 10.1557/PROC-101-403
A rotating-compensator fourier ellipsometer, Optics Communications, vol.14, issue.4, pp.43-437, 1975. ,
DOI : 10.1016/0030-4018(75)90012-7
alloys, Physical Review B, vol.153, issue.18, pp.13107-731, 1988. ,
DOI : 10.1103/PhysRev.153.659
URL : https://hal.archives-ouvertes.fr/hal-01334926
Determination of the optical constants of ZnSe films by spectroscopic ellipsometry, Journal of Applied Physics, vol.50, issue.1, pp.574-577, 1994. ,
DOI : 10.1063/1.333785
Ellipsometric investigation of thickness dependence of the optical constants of thin tungsten oxide fi.lms, Thin Solid Films, vol.2, issue.3, pp.22-226, 1991. ,
Ellipsometry of clean surfaces, submonolayer and monolayer films, Surface Science, vol.96, issue.1-3, pp.482-507, 1980. ,
DOI : 10.1016/0039-6028(80)90322-2
Optical Measurements on Liquid Metals Using a New Ellipsometer, Journal of the Optical Society of America, vol.58, issue.1, pp.102-108, 1967. ,
DOI : 10.1364/JOSA.58.000102
Ellipsometric analyses for an absorbing surface film on an absorbing substrate with or without an intermediate surface layer, Surface Science, vol.56, pp.97-108, 1976. ,
DOI : 10.1016/0039-6028(76)90437-4
Optics of thinflrns (North-Holland, 1960. ,
Les méthodes optiques de caractérisation des couches minces : un point de vue industriel, Acta Electronica, vol.24, pp.125-130, 1981. ,
Ellipsometric function of a film???substrate system: characterization and detailed study, Journal of the Optical Society of America A, vol.6, issue.3, pp.355-366, 1989. ,
DOI : 10.1364/JOSAA.6.000355
Generalized ellipsometric method for the determination of all the system : Optically absorbing film ou absorbing substrate, Surface Science, vol.56, issue.1e76, pp.4-63 ,
Fourier transform detection system for rotating-analyzer ellipsometers, Optics Communications, vol.8, issue.3, pp.222-225, 1973. ,
DOI : 10.1016/0030-4018(73)90132-6
Design and Operation of ETA, an Automated Ellipsometer, IBM Journal of Research and Development, vol.17, issue.6, pp.472-489, 1973. ,
DOI : 10.1147/rd.176.0472
Polarisation de la lumi,ère-Modulation aeou ,
On Calculating the Optical Constants from Reflection Coefficients, Journal of the Optical Society of America, vol.29, issue.6, p.235, 1939. ,
DOI : 10.1364/JOSA.29.000235
An Improved for High Reflectivity Ellipsometry Based on a New polarization Modulation Technique, Rev. Sc. Instr, vol.40, issue.161e6e, pp.76-767 ,
A modulated ellipsometer for studying thin film optical properties and surface dynamics, Surface Science, vol.37, pp.548-558, 1973. ,
DOI : 10.1016/0039-6028(73)90345-2
Thèse de doctorat d'état, 1987. ,
Improvements of phase???modulated ellipsometry, Review of Scientific Instruments, vol.262, issue.1, pp.65-77, 1989. ,
DOI : 10.1364/AO.22.000592
Systematic errors in rotating-compensator ellipsometry, Journal of the Optical Society of America A, vol.11, issue.9, pp.2550-2559, 1994. ,
DOI : 10.1364/JOSAA.11.002550
High Precision Scanning Ellipsometer, Applied Optics, vol.14, issue.1, pp.1-4 ,
DOI : 10.1364/AO.14.000220
Phase???modulated ellipsometer using a Fourier transform infrared spectrometer for real time applications, Review of Scientific Instruments, vol.64, issue.8, pp.2153-215 ,
DOI : 10.1016/0169-4332(93)90515-D
Waveform analysis with optical multichannel detectors: Applications for rapid???scan spectroscopic ellipsometry, Review of Scientific Instruments, vol.822, issue.8, pp.7904-7905 ,
DOI : 10.1364/AO.28.003226
Ellipsometrie spectroscopique du proche IR au proche UV., appareiilage et méthodologie. Application à l'étude de I'implantation ionique dans les semi-conducteurs, Thèse de doctorat, 1982. ,
Novel fast spectroscopic rotating???polarizer ellipsometer, Review of Scientific Instruments, vol.64, issue.6, pp.468-473, 1993. ,
DOI : 10.1063/1.347274
Generalized rotating-compensator ellipsometry, Surface Science, vol.56, issue.1e76, pp.148-160 ,
DOI : 10.1016/0039-6028(76)90442-8
Rotating-compensator/analyzer fixed-analyzer ellipsometer: Analysis and comparison to other automatic ellipsometers, Journal of the Optical Society of America, vol.66, issue.9, pp.949-954, 1976. ,
DOI : 10.1364/JOSA.66.000949
Contribution à l'étude d'un ellipsomètre spectroscopique : Mise en aeuvre' Programme d'exploitation, Calibrage, Erreurs systématiques, Détection, 1995. ,
Contribution à l'étude d'un ellipsomètre spectroscopique: Mise en aeuvre, Programme d'exploitation, Calibrage, Erreurs aléatoires, Systèmes optiques" (Mémoire CNAM, 1995. ,
Conventions and formulas for using the Mueller-Stokes calculus in ellipsometry, 1980. ,
Conventions and formulas for using the Mueller-Stokes calculus in ellipsometry, Surface Science, vol.96, issue.1-3, p.81, 1980. ,
DOI : 10.1016/0039-6028(80)90296-4
Calibration method for rotating-analyzer ellipsometers, Journal of the Optical Society of America A, vol.5, issue.9, pp.1466-7471, 1988. ,
DOI : 10.1364/JOSAA.5.001466
Effects of component optical activity in data reduction and calibration of rotating-analyzer ellipsometers, Journal of the Optical Society of America, vol.64, issue.6, pp.12-20, 1974. ,
DOI : 10.1364/JOSA.64.000812
Contribution à I'amélioration des performances d'un ellipsomètre à compensateur tournant, Mémoire CNAM, 1993. ,
Contribution à la détermination des erreurs systématiques d'ellipsomètres à élément tournant, Mémoire CNAM, 1994. ,
Contribution de la mise au point d'un ellipsomètre à élément tournant ,
A Simplex Method for Function Minimization, The Computer Journal, vol.7, issue.4, pp.308-313, 1965. ,
DOI : 10.1093/comjnl/7.4.308
The optical properties of liquid metals, Advances in Physics, vol.6, issue.64, p.629, 1967. ,
DOI : 10.1080/00018735700101166
Drude Theorie and Optical Properties of Liquid Mercury, Phys. Letters, vol.26, issue.1e68, p.726 ,
The optical properties of liquid germanium, tin and lead, Philosophical Magazine, vol.2, issue.64 ,
DOI : 10.1098/rspa.1934.0166
The optical properties of liquid metals, Philosophical Magazine, vol.6, issue.4, pp.817-831 ,
DOI : 10.1080/14786436108243361
Optical properties of liquid Pb and Bi between 0.6 and 3.7 eV, Physical Review B, vol.8, issue.10, pp.6130-6138 ,
DOI : 10.1103/PhysRevB.8.5452
Opticalproperties of Liquid Tin between 0,62 and 3,7eV, Phys. Rev, vol.21, issue.1e80, pp.3043-3046 ,
Dielectric function of liquid tin between 250 and 1100??C, Physical Review B, vol.17, issue.6, pp.4248-4257, 1982. ,
DOI : 10.1103/PhysRevB.17.2427
Optical properties of polyvalent metals in the solid and liquid state: lead, Journal of Physics: Condensed Matter, vol.7, issue.5, pp.907-916, 1995. ,
DOI : 10.1088/0953-8984/7/5/013
Optical Properties of Vacuum-Evaporated White Tin, Physical Review, vol.113, issue.3, p.615, 1967. ,
DOI : 10.1103/PhysRev.113.1254
The Optical Constants of Liquid Alloys, Physical Review, vol.182, issue.6, pp.1-4, 1961. ,
DOI : 10.1016/S0016-0032(16)90809-3
Absolute Values of the Optical Constants of Some Pure Metals, Physica Scripta, vol.4, issue.6, p.291, 1971. ,
DOI : 10.1088/0031-8949/4/6/009
Density and Compressibility of Liquid Li-Pb Alloys, Zeitschrift f??r Naturforschung A, vol.31, issue.1, pp.31-47, 1976. ,
DOI : 10.1515/zna-1976-0106
A neutron diffraction investigation of liquid lithium-lead alloys, Physics Letters A, vol.46, issue.1, p.75, 1973. ,
DOI : 10.1016/0375-9601(73)90692-0
The Foundations of Optics, J. Opt. Soc. Am, vol.38, p.661, 1948. ,
On the Composition and Resolution of Streams of Polarized Light from different Sources, Tlans. Cambridge Phil. Soc, vol.9, pp.399-169, 1852. ,
DOI : 10.1017/CBO9780511702266.010