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, Die kritische Kraft F c beinhaltet die Gitterreibungskraft (primär) und andere Wechselwirkungskräfte, wie z.B. die Wechselwirkungskräfte zwischen einer Versetzung und einer Lerstelle, etc. Dann kann diese kritische Kraft in eine kritische Schubspannung auf eine Versetzung Versetzung umgewandelt werden, indem F c durch die Länge des Burgersvektors ? c = F c / |b| geteilt wird. Es sei darauf hingewiesen, dass der angelegte homogene Spannungstensor ? ext in der vorliegenden Arbeit nur zum Gleichgewichtsausgleich des Versetzungs-Pile-ups dient. Die Berechnung der Gleichgewichtspositionen des Versetzungs-Pile-ups erfolgt somit nach einem iterativen Relaxationsschema, das all die kritischen Kräften F (?), Spannungstensor (erzeugt durch die Spannungswechselwirkungen aller anderen Versetzungen ? dis und die Bildversetzungen ? im ) auf die ? th Versetzung

, Normalerweise ist die Position der ersten (oder führenden) Versetzung (X 1 (1) , X 2 (1)) fixiert [97, 105, einem heterogenen Medium kann jedoch diese Bildkraft auf die führende Versetzung die angewandte Spannung und den Spannungsbeitrag aus den anderen Versetzungen ausgleichen werden, vol.105

. Aber-nur-bei-abstoßenden-bildkräften, In diesem Fall könnten alle Versetzungspositionen, einschließlich der führenden, durch das iterative Relaxationsschema gefunden werden. Die meisten Forscher gehen von F c = 0 N/m aus, da der Wert der Reibspannung im reinen kfz-Kristall gering ist

A. , der vorliegenden Arbeit, wird festgestellt, dass eine nicht Null kritische Kraft hat einen entscheidenden Einfluss auf das Versetzungsverhalten in Anwesenheit von KG und freien Oberflächen. Der Grund dafür ist, dass es bereits nach der Probenvorbereitung Gitterfehler im Material gibt, wie z.B. Defekte nahe der Oberfläche durch die Ga + -Ionen, vol.139

, Darüber hinaus ist der theoretische Wert der Reibkraft für ?-Brass als Legierung viel höher als reine kfz-Kristalle, wie z.B. Ni. Zum Beispiel, es wurde festgestellt, dass Reibkraft ? c für ?-Brass zwischen

, KG-Steifigkeit und freie Oberfläche, abzuschätzen, wurden mehrere Simulationen mit idealen Bedingungen (theoretische Untersuchung) durchgeführt ? Im Falle einer anisotropen Elastizität gibt es eine Gleichgewichtsposition für die Versetzung, in der F im eine Vorzeichenänderung aufgrund der gekoppelten Effekte der Bildkräfte aufweist. Die Bildkräfte resultieren sowohl aus dem unteren Kristall als auch aus der KG mit inversem Effekt, wie z.B. A Ori mit ? = 2 oder B Ori mit ? = 0, 5. Wenn der untere Kristall und die KG den gleichen Effekt haben, Vorläufige theoretische Ergebnisse und Diskussion der einzeln Versetzungen und Versetzungs-Pile-ups in Ni-Bikristalle Um die Wirkung von verschiedenen mikrostrukturellen Faktoren, wie z.B. die Missorientierung

?. Die, Wirkungsabstand der KG-Steifigkeit ist ziemlich klein mit etwa 41 |b| für ? = 2 und 58 |b| für ? = 0, 5. Es ist jedoch wichtig, die führende Versetzung des Pile-ups ausgleichen zu können, Über diese Abstände hinaus, die Bildkraft ist hauptsächlich von der Missorientierung der Bi-Kristalle abhängig

. ?-für-isotrope-tri-materielle-konfigurationen, die Bildkraft hängt nur von der KG-Steifigkeit aufgrund des Missorientierungs-Effektes durch den unteren Kristall ab

, Seitenfläche im Kristall II (B4 und D6) wechselwirken. Basierend auf der Richtung der Gleitlinien und des Schmid-Faktors (oder der Inkompatibilitätsspannung) für jedes Gleitsystem, wie in Abbildung 1.15 dargestellt, die aktiven Gleitsysteme im Kristall I sind A6 und C5 und im Kristall II B4 und D6. Somit gibt es in beiden Körnern in der ?-Brass-Probe Mehrfachgleitung

, Figure 1.15: REM-Bild eines ?-Brass-Bi-Kristalls nach dem Drucktest zur kristallographischen Analyse der Gleitlinien. Basierend auf der Richtung der Gleitlinien, der Orientierung jedes Kristalls und des Schmid-Faktors (oder der Inkompatibilitätsspannungsanalyse) wird das Gleitsystem A6 und C5 im Kristall I und B4 im Kristall II aktiviert

, Es wird festgestellt, dass der Höhenunterschied zwischen zwei Linien an der KG ?h KG ? 0, 86 nm nicht null ist. Dieser Wert entspricht einer schwachen Versetzungstransmission, Dann wurde die relative Höhe dieser Stufe ?h als Differenz der gefitteten Höhe zwischen diesen beiden Linien berechnet (siehe Abbildung 1.17), vol.1, p.16

, AFM-Scan der gesamten oberen Oberfläche und (b) der AFM-Scan, der lokale Transmission an der KG zeigt (rote viereckige Markierung). Der rote Pfeil zeigt die Belastungsrichtung an, Figure 1.16: AFM-Oberflächentopographie der Ni-Probe: (a)

, Address: 022-R+3, 7 rue Félix Savart, F-57070 METZ e-mail: cxl900705@gmail.com Telephone: +33 (0), p.661718024

, Internship of 1 month in Institute NEEL, pp.6-2014, 2014.

, Misorientation dependence of the grain boundary migration rate: role of elastic anisotropy, Philosophical Magazine, pp.1-22, 2009.

?. X. Chen, T. Richeton, C. Motz, and S. Berbenni, Atomic Force Microscopy Study of Discrete Dislocation Pile-ups at Grain Boundaries in Bi-Crystalline Micro-Pillars, Crystals, vol.10, p.411, 2020.
URL : https://hal.archives-ouvertes.fr/hal-02648680

?. X. Chen, T. Richeton, C. Motz, and S. Berbenni, Elastic fields due to dislocations in anisotropic bi-and tri-materials: Applications to discrete dislocation pile-ups at grain boundaries, International Journal of Solids and Structures, vol.164, pp.141-156, 2019.
URL : https://hal.archives-ouvertes.fr/hal-02360489

, Conference participations ? 1st Colloquium on Theoretical and Experimental Micro-Mechanics, 2019.

M. ?-nanomechanical-testing-in, . Research, V. Development, . Malaga, and . Spain, , 2019.

, ? Intergranular and interphase boundaries in materials (IIB2019), 2019.

/. Lund, ? International conference on material modelling (ICMM6), pp.26-28

?. Spring, , pp.15-22, 2018.

P. ?-colloque, , pp.9-11, 2018.

?. Sem, . Ebsd, . Edx, . Fib, . Xrd et al., Nano-Indentation, Micro-traction, Ion Milling, Electro-polishing

?. Softwares, . Matlab, . Mathematica, . Python, . Lammps et al., Latex Languages ? Mandarin: mother language ? French: read, written, spoken ? English: read, written, spoken, p.1

L. Fête-de, 10 hours Formationà la culture de prévention Metz: 6 hours Seminar of doctoral school EMMA: 8 hours EMMA 05: Modelling of crystal behavior and textures: 24 hours, 5 points EMMA 09: Méthodes numériques en mécanique des solides déformables: 20 hours, 4 points ? Saarbrücken Graduate School Methodik, Nano-und mikromechnische Messmethoden, vol.7, 2018.

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