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Spectroscopic ellipsometric characterization of approximant thin films of Al–Cr–Fe

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https://hal.univ-lorraine.fr/hal-02900545
Contributor : Laurent Broch <>
Submitted on : Thursday, July 16, 2020 - 11:18:51 AM
Last modification on : Thursday, March 25, 2021 - 3:01:43 AM

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L. Johann, A. En Naciri, L. Broch, V. Demange, J. Ghambaja, et al.. Spectroscopic ellipsometric characterization of approximant thin films of Al–Cr–Fe. Applied Surface Science, Elsevier, 2003, 207 (1-4), pp.300-305. ⟨10.1016/S0169-4332(02)01504-0⟩. ⟨hal-02900545⟩

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