Spectroscopic ellipsometric characterization of approximant thin films of Al–Cr–Fe - Université de Lorraine Access content directly
Journal Articles Applied Surface Science Year : 2003

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hal-02900545 , version 1 (16-07-2020)

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L. Johann, A. En Naciri, L. Broch, Valérie Demange, J. Ghambaja, et al.. Spectroscopic ellipsometric characterization of approximant thin films of Al–Cr–Fe. Applied Surface Science, 2003, 207 (1-4), pp.300-305. ⟨10.1016/S0169-4332(02)01504-0⟩. ⟨hal-02900545⟩
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