Accurate calibration and optimized measurement: use of an achromatic compensator in rotating polarizer spectroscopic ellipsometry
Résumé
We describe an improvement of a Rotating Polarizer Ellipsometer in order to increase the sensitivity for the measurement of a transparent sample. We added a compensator, namely a quasi-achromatic retardation quarter wave plate on the 400-700nm spectral range. This new configuration is named Polarizer Rotating-Polarizer Compensator Spectroscopic Ellipsometer (PRPCSE). We present a method for calibration and the advantages for measurement of the transparent materials. This method is applied to CuCl nanocrystals embedded in a NaCl transparent matrix.
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