La caractérisation mécanique de systèmes film-substrat par indentation instrumentée (nanoindentation) en géométrie sphère-plan

Abstract : Depth sensing Indentation (nanoindentation) is an experimental technique increasing retained for the assessment of the mechanical properties of materials (hardness H, Young's modulus E) for which common homogeneous mechanical tests can not be performed or are extremely difficult to perform. The mechanical parameters are obtained from the indentation curve (the plot of the load vs penetration depth during both load and unload). Usually, some methodology reported in the literature (Oliver and pharr, Field and Swain, Doener and Nix, Loubet and al.) are used in order to assess E and H. We have performed a number of experiments on homogeneous materials (stainless steel AISI304, AISI316, AISI430; high-speed steel HSS652; glass SiO2) as well as a film-substrate system (TiN/AISI430, TiN/HSS652, TiO2/HSS652). Applying the Oliver and Pharr methodology, E end H vary with the applied load as well as the percentage of used unload curve retained for the analysis, as reported in the literature. Besides, in the case of the film-substrate system, only composite parameters are obtained instead of the in-situ films properties. In order to establish a simple strategy for the determination of the elastic modulus of a hard coating, we have carried out many simulations using a boundary element based numerical tool. Then a number of useful results have been identified. The well known elastic relation [delta]=a2/R between the relative approach [delta], the projected contact radius a and the punch radius R, remain valid in the plastic range for homogeneous as well as film-substrate specimens. This allows data indentation to be represented in term of mean pressure F/[pi]a2 vs indentation strain a/R . The initial slope of the loading part of the latter curve is proportional to the elastic modulus of the film, while the slope of the initial part of the unloading curve is proportional to the substrate elastic modulus. Our indentation procedure anlysis has been validated experimentally on a number of samples (TiN/AISI430, TiN/HSS652, TiO2/HSS652) after having established a relation between the punch displacement and the relative approach [delta]
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Noura Oumarou. La caractérisation mécanique de systèmes film-substrat par indentation instrumentée (nanoindentation) en géométrie sphère-plan. Autre. Institut National Polytechnique de Lorraine, 2009. Français. ⟨NNT : 2009INPL001N⟩. ⟨tel-01748749⟩

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