Caractérisation de couches minces nanostructurées par ellipsométrie spectroscopique : application aux propriétés optiques isotropes et anisotropes de nanoparticules sphériques et ovoïdes de cobalt

Abstract : Thin layers containing cobalt nanostructures in the [4-10] nanometers size range, obtained after implantation of Co+ ions into a silica thin layer on silicon substrate, have been characterized by spectroscopic ellipsometry. An optical model makes it possible to precisely return account of the structure of the implanted layer. After An exhaustive study of the various effects such as implantation profile, size effects, oxidation of the particles and defects of silica, it has been shown that the nanostructured layers can be represented by an effective layer made of a mixture of cobalt clusters and silica between two layers of silica. The prospects and applications offered by this model are very numerous. It is used in particular for the study of the magneto-optical properties of the cobalt clusters. We have also studied nanostructred layers made of ovoid cobalt particles by generalized ellipsometry. Intstrumental and theoretical methods for anisotropy have been developed. A link between the shape anisotropy and the optical anisotropy has been established. Ellipsometry allows to reach the geometry of the sample and to study accurately the anisotropic optical properties of ovoid particles and magneto-optical anisotropy which could be made profitable in future data storage devices.
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Mickaël, Christophe, Patrick Gilliot. Caractérisation de couches minces nanostructurées par ellipsométrie spectroscopique : application aux propriétés optiques isotropes et anisotropes de nanoparticules sphériques et ovoïdes de cobalt. Autre [cond-mat.other]. Université Paul Verlaine - Metz, 2006. Français. ⟨NNT : 2006METZ030S⟩. ⟨tel-01752448⟩

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