Mesure de déformation par CBED : développement et application d'une approche multi-clichés

Abstract : The knowledge of strains and stresses is important for a better understanding of the materials properties. Several experimental techniques are available (XRD, Raman ...), but only one allows the determination of the strain at a microscopic scale: the Convergent Beam Electron Diffraction (CBED). This technique is known for its high spatial resolution (of a few nanometers), which comes from its use in a Transmission Electronic Microscope (TEM). The diffraction patterns acquired with a convergent beam are constituted of HOLZ lines whose localization depends on the values of the lattice parameters or strain of the material. The comparison of the lines position between an experimental and a simulated pattern allows the determination of the lattice parameters. In this work, we have applied a new approach for the lattice parameters determination. It is based on the algebraic equation of "K-lines" and enables to work simultaneously on several diffraction patterns. We have quantified the uncertainty linked to the KLEBS approach. The causes of the uncertainty have been presented and we have proposed a statistical approach (multiple patterns) to reduce its value. Then, the multiple patterns approach has been applied to the study of the single crystal nickel based superalloys, and a new method for the misfit determination has been proposed. The last part of this work deals with the study of the strain heterogeneities in a material plastically strained
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Guillaume Brunetti. Mesure de déformation par CBED : développement et application d'une approche multi-clichés. Autre. Université Paul Verlaine - Metz, 2009. Français. ⟨NNT : 2009METZ031S⟩. ⟨tel-01752656⟩

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