Analyse et étude de profils de raies de diffraction des rayons X enregistrées avec un détecteur courbe : application à l'analyse de propriétés microstructurales de matériaux et notion d'indicatrice

Abstract : This study presents works done by using a curved position sensitive detector in the field of X-ray diffraction analysis. The introduction of exeprimental technics allow us to use this detector with a very high accuracy. We propose a simplified expression of asymetric Pearson VII distribution for the fitting and dessomation of mixed X-ray line profiles. We introduce usefull technics for the measurement of residual stresses analysis for large grain materials (discontinuous integration and diffraction lines smoothing). We developpe and extended the pole figure concept to the other X-ray line characteristics (named indicatrix). Using them formal relation between size of the coherently diffracting domains and micro-strain are obtained. The distribution of integrated intensity versus form factor of X-ray line profile show us in cunjunction with X-ray line breadth, that it is one of the best descriptive parameter for polycristalline materials analysis. Using well-known relationships, the relation between size and micro-stress present some analogy with the Hall-Petch relationship. The study of oscillation in graph giving the deformation versus the measurement direction present predominent effect of microstructural parameter such as domain size or micro-strain. This work allow us to say that the indicatricies which reflect structural anisotropy are usefull tools for polycristalline materials analysis
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Albert Tidu. Analyse et étude de profils de raies de diffraction des rayons X enregistrées avec un détecteur courbe : application à l'analyse de propriétés microstructurales de matériaux et notion d'indicatrice. Autre [cond-mat.other]. Université Paul Verlaine - Metz, 1990. Français. ⟨NNT : 1990METZ004S⟩. ⟨tel-01775853⟩

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