Adaptation de méthodes goniométriques à l'étude par diffraction X des textures de couches minces et de multicouches

Abstract : The aim of this work was to establish correction laws to be applied on diffracted intensity when studying thin layers or multilayers by XRD. These laws are experimentally verified and are of the outmost importance for quantitative texture studies. Two kinds of diffraction geometries were used : "the Bragg-Brentano" the low incidence" ones. The former suffers from some limitation for the study of thin layers. The latter allows to enlarge the diffracted volume and therefore the diffracted intensities. Both "Schulz" and "low incidence MPF" (multi-pôle figures) geometric technics were studied and compared. This study, shows that texture goniometry gives very accurate information texture of multilayers and films thiner than a few hundred Angströms. The correction laws were applied to any kind of incidence in the case of (Fe+Al)/Si multilayers allowing to fully determine the orientation relationships between aluminium and iron according to the silicon
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Abdeslem Tizliouine. Adaptation de méthodes goniométriques à l'étude par diffraction X des textures de couches minces et de multicouches. Autre [cond-mat.other]. Université Paul Verlaine - Metz, 1994. Français. ⟨NNT : 1994METZ009S⟩. ⟨tel-01776039⟩

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