Memristive behaviour of high-impedance faults - Université de Lorraine
Journal Articles Electronics Letters Year : 2016

Memristive behaviour of high-impedance faults

Etienne Tisserand
Yves Berviller
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hal-01397368 , version 1 (15-11-2016)

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Etienne Tisserand, Yves Berviller, Jean-Baptiste Humbert. Memristive behaviour of high-impedance faults. Electronics Letters, 2016, 52 (4), pp.300 - 302. ⟨10.1049/el.2015.3738⟩. ⟨hal-01397368⟩
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