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Memristive behaviour of high-impedance faults

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https://hal.univ-lorraine.fr/hal-01397368
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Submitted on : Tuesday, November 15, 2016 - 5:09:43 PM
Last modification on : Monday, April 6, 2020 - 2:44:03 PM

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Etienne Tisserand, Yves Berviller, Jean-Baptiste Humbert. Memristive behaviour of high-impedance faults. Electronics Letters, IET, 2016, 52 (4), pp.300 - 302. ⟨10.1049/el.2015.3738⟩. ⟨hal-01397368⟩

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