Memristive behaviour of high-impedance faults

Etienne Tisserand; Yves Berviller; Jean-Baptiste Humbert

doi:10.1049/el.2015.3738

Journal Articles Electronics Letters Year : 2016

Memristive behaviour of high-impedance faults

(1) , (1) , (1)

1

Etienne Tisserand

Function : Author
PersonId : 173719
IdHAL : etienne-tisserand
ORCID : 0000-0002-2088-3598
IdRef : 033275149

Institut Jean Lamour

Yves Berviller

Function : Author
PersonId : 1140949
IdHAL : yves-berviller
ORCID : 0000-0002-0059-3024
IdRef : 177352906

Institut Jean Lamour

Jean-Baptiste Humbert

Function : Author

Institut Jean Lamour

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Electronics Micro and nanotechnologies/Microelectronics Signal and Image processing

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https://hal.univ-lorraine.fr/hal-01397368

Submitted on : Tuesday, November 15, 2016-5:09:43 PM

Last modification on : Thursday, April 11, 2024-1:08:13 PM

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hal-01397368 , version 1 (15-11-2016)

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HAL Id : hal-01397368 , version 1
DOI : 10.1049/el.2015.3738

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Etienne Tisserand, Yves Berviller, Jean-Baptiste Humbert. Memristive behaviour of high-impedance faults. Electronics Letters, 2016, 52 (4), pp.300 - 302. ⟨10.1049/el.2015.3738⟩. ⟨hal-01397368⟩

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Memristive behaviour of high-impedance faults

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