We compare, from a crystallographic point of view, the data quality obtained using laboratory x-ray diffractometers equipped with a Molybdenum micro-source using different detector types: CCD, CMOS and XPAD hybrid pixel. First we give an overview of the working principle of these different detector types with a focus on their principal differences and their impact on the data quality. Then, using the example of an organic crystal, a comparison between the detector systems concerning the raw data statistics, the refinement agreement factors, the deformation electron density maps, and the residual density after multipolar refinement is presented. It is found that the data quality obtained with the XPAD detector is the best, even though the detection efficiency at the Mo energy (17.5 keV) is only 37% due to the Si-sensor layer thickness of 300 mu m. Finally, we discuss the latest x-ray detector developments with an emphasis on the sensor material, where replacing Si by another material such as GaAs would yield detection efficiencies close to 100%, up to energies of 40 keV for hybrid pixel detectors.