Journal Articles Advanced Materials Research Year : 2014

Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection

Domains

Materials

Dates and versions

hal-01653215 , version 1 (01-12-2017)

Identifiers

Cite

Raphaëlle Guillou, Pierre P. Renault, Éric Le Bourhis, Philippe Goudeau, Pierre Godard, et al.. Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection. Advanced Materials Research, 2014, 996, pp.878 - 883. ⟨10.4028/www.scientific.net/amr.996.878⟩. ⟨hal-01653215⟩
460 View
0 Download

Altmetric

Share

More