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Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection

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https://hal.univ-lorraine.fr/hal-01653215
Contributor : Florimonde Lebel <>
Submitted on : Friday, December 1, 2017 - 11:06:14 AM
Last modification on : Monday, October 26, 2020 - 4:16:01 PM

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Raphaëlle Guillou, Pierre Renault, Eric Le Bourhis, Philippe Goudeau, Pierre Godard, et al.. Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection. Advanced Materials Research, Trans Tech Publications, 2014, 996, pp.878 - 883. ⟨10.4028/www.scientific.net/amr.996.878⟩. ⟨hal-01653215⟩

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