Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection
Raphaëlle Guillou
(1)
,
Pierre P. Renault
(1)
,
Eric Le Bourhis
(1)
,
Philippe Goudeau
(1)
,
Pierre Godard
(1)
,
Guillaume Geandier
(2)
,
Damien Faurie
(3)
,
Dominique Thiaudière
(4)
,
Cristian Mocuta
(4)
Pierre P. Renault
- Function : Author
- PersonId : 169785
- IdHAL : pierre-renault
- ORCID : 0000-0002-1890-1865
- IdRef : 03411971X
Pierre Godard
- Function : Author
- PersonId : 762183
- ORCID : 0000-0002-5402-6033
- IdRef : 140798072
Guillaume Geandier
- Function : Author
- PersonId : 755902
- ORCID : 0000-0002-9459-1758
Cristian Mocuta
- Function : Author
- PersonId : 758731
- ORCID : 0000-0001-5540-449X
- IdRef : 200868470