Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection - Université de Lorraine Access content directly
Journal Articles Advanced Materials Research Year : 2014

Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection

Pierre P. Renault
Eric Le Bourhis
  • Function : Author
  • PersonId : 1078770
Philippe Goudeau
  • Function : Author
Pierre Godard
Guillaume Geandier
Cristian Mocuta

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Materials

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hal-01653215 , version 1 (01-12-2017)

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Raphaëlle Guillou, Pierre P. Renault, Eric Le Bourhis, Philippe Goudeau, Pierre Godard, et al.. Time-Resolved X-Ray Stress Analysis in Multilayered Thin Films during Continuous Loading: Use of 2D Remote Detection. Advanced Materials Research, 2014, 996, pp.878 - 883. ⟨10.4028/www.scientific.net/amr.996.878⟩. ⟨hal-01653215⟩
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