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Frequency analysis for investigation of the thermomechanical mechanisms in thermal oxides growing on metals

Abstract : In the present work, mechanical features in thermal oxide films growing on metals have been investigated during cyclic thermal loadings. An adapted model is considered to describe the stress evolution within oxide films, taking into account thermomechanical couplings. These numerical predictions are compared with experimental results obtained using synchrotron diffraction at ESRF. In order to obtain the features of the system, an innovative data treatment is thus proposed and performed. By dealing with the frequency analysis of the system, the method is able to identify some mechanisms. This mechanical spectroscopy allows thus to confirm the thermomechanical description of a chromia-former alloy.
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https://hal.univ-lorraine.fr/hal-01653498
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Submitted on : Friday, December 1, 2017 - 3:12:10 PM
Last modification on : Sunday, June 26, 2022 - 4:47:28 AM

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Benoît Panicaud, Jean-Luc Grosseau-Poussard, Zhaojun Tao, Felaniaina Rakotovao, Guillaume Geandier, et al.. Frequency analysis for investigation of the thermomechanical mechanisms in thermal oxides growing on metals. Acta Mechanica, Springer Verlag, 2017, 228 (10), pp.3595 - 3617. ⟨10.1007/s00707-017-1899-z⟩. ⟨hal-01653498⟩

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