A novel diode open circuit fault detection in three phase rectifier based on k-means method

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https://hal.univ-lorraine.fr/hal-01873816
Contributor : Latifa Zoua <>
Submitted on : Thursday, September 13, 2018 - 3:59:05 PM
Last modification on : Tuesday, September 25, 2018 - 3:19:08 PM

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Mehdi Rahnama, Abolfaz Vahedi, Arta Mohammad Alikhani, Noureddine Takorabet, Babak Fazelbakhsheshi. A novel diode open circuit fault detection in three phase rectifier based on k-means method. 2018 IEEE International Conference on Industrial Technology (ICIT), Feb 2018, Lyon, France. ⟨10.1109/ICIT.2018.8352246⟩. ⟨hal-01873816⟩

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