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Article Dans Une Revue Powder Technology Année : 2005

Comparison of methods for the characterisation by image analysis of crystalline agglomerates: The case of gibbsite

Résumé

Four imaging techniques (light microscopy technique (P-OM), scanning electron microscopy with a secondary electron detector applied to powders (P-SE-SEM), scanning electron microscopy with a backscattered electron detector applied to polished sections of powders embedded in a resin, without chemical etching (S-BS-SEM) and scanning electron microscopy with a secondary electron detector applied to polished sections of powders embedded in a resin, with chemical etching (S-SE-SEM)) have been applied to crystalline agglomerates (gibbsite) to illustrate the possibilities of structural characterisation and comparison based on image analysis procedures. If P-OM can be easily applied in industry, once a suitable immersion liquid has been selected, the information collected from P-SE-SEM on the external structure is more detailed. S-BS-SEM enables the visualisation of larger sets of particles but bias, due to sectioning, should be accepted. It is related to the shape of particles. S-SE-SEM provides information on the external structure as S-BS-SEM and, in addition, on the internal structure, but with a lower output than S-BS-SEM.

Dates et versions

hal-01967105 , version 1 (30-12-2018)

Identifiants

Citer

Marie-Noëlle Pons, V. Plagnieux, H. Vivier, D. Audet. Comparison of methods for the characterisation by image analysis of crystalline agglomerates: The case of gibbsite. Powder Technology, 2005, 157 (1-3), pp.57-66. ⟨10.1016/j.powtec.2005.05.011⟩. ⟨hal-01967105⟩
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