Temperature Dependency of Silicon Carbide MOSFET On-Resistance Characterization and Modeling

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https://hal.univ-lorraine.fr/hal-02337818
Contributor : Jean-Philippe Martin <>
Submitted on : Tuesday, October 29, 2019 - 4:19:48 PM
Last modification on : Thursday, November 7, 2019 - 11:23:26 AM

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Dinh Lam Dang, Matthieu Urbain, Stéphane Rael. Temperature Dependency of Silicon Carbide MOSFET On-Resistance Characterization and Modeling. Materials Science Forum, Trans Tech Publications Inc., 2019, 963, pp.592-595. ⟨10.4028/www.scientific.net/MSF.963.592⟩. ⟨hal-02337818⟩

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