Soft X-ray resonnant magnetic reflectivity study of thin films and multilayers - Université de Lorraine Access content directly
Conference Papers Year : 1998
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hal-02563344 , version 1 (05-05-2020)

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  • HAL Id : hal-02563344 , version 1

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Jean-Marc Tonnerre, A. Barbara-Déchelette, F. Bartolomé, D. Raoux, V. Chakarian, et al.. Soft X-ray resonnant magnetic reflectivity study of thin films and multilayers. 7th joint MMM Intermag Conference, 1998, San Francisco, United States. ⟨hal-02563344⟩
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