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Soft X-ray resonnant magnetic reflectivity study of thin films and multilayers

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https://hal.univ-lorraine.fr/hal-02563344
Contributor : Hélène Fischer <>
Submitted on : Tuesday, May 5, 2020 - 11:45:45 AM
Last modification on : Saturday, February 13, 2021 - 1:28:02 PM

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Jean-Marc Tonnerre, A. Barbara-Déchelette, F. Bartolomé, D. Raoux, V. Chakarian, et al.. Soft X-ray resonnant magnetic reflectivity study of thin films and multilayers. 7th joint MMM Intermag Conference, 1998, San Francisco, United States. ⟨hal-02563344⟩

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