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https://hal.univ-lorraine.fr/hal-02563344
Submitted on : Tuesday, May 5, 2020-11:45:45 AM
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Jean-Marc Tonnerre, A. Barbara-Déchelette, F. Bartolomé, D. Raoux, V. Chakarian, et al.. Soft X-ray resonnant magnetic reflectivity study of thin films and multilayers. 7th joint MMM Intermag Conference, 1998, San Francisco, United States. ⟨hal-02563344⟩
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