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Journal Articles Journal of Applied Physics Year : 1998

Soft X-ray resonnant magnetic reflectivity study of thin films and multilayers

Abstract

Soft x-ray resonant magnetic reflectivity measurements on thin films and multilayers in a transverse geometry using linear polarized photons are presented. Magneto-optic calculations taking into account the layer roughness allows us to reproduce all the experimental features of the angular and energy reflectivity curves as well as the asymmetry ratio in both cases. Application to FexMn1−x alloy films epitaxially grown on Ir(001) brings more insights on the magnetic transition occurring at x=0.75.
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hal-02563353 , version 1 (05-05-2020)

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Jean-Marc Tonnerre, A. Barbara-Déchelette, F. Bartolomé, Denis Raoux, V. Chakarian, et al.. Soft X-ray resonnant magnetic reflectivity study of thin films and multilayers. Journal of Applied Physics, 1998, 83, pp.6293. ⟨10.1063/1.367837⟩. ⟨hal-02563353⟩
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