Jean-Marc Tonnerre, A. Barbara-Déchelette, F. Bartolomé, Denis Raoux, V. Chakarian, et al.. Soft X-ray resonnant magnetic reflectivity study of thin films and multilayers.
Journal of Applied Physics, American Institute of Physics, 1998, 83, pp.6293.
⟨10.1063/1.367837⟩.
⟨hal-02563353⟩