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Journal Articles Applied optics Year : 2010

Second-order systematic errors in Mueller matrix dual rotating compensator ellipsometry

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hal-02900595 , version 1 (16-07-2020)

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Laurent Broch, Aotmane En Naciri, Luc Johann. Second-order systematic errors in Mueller matrix dual rotating compensator ellipsometry. Applied optics, 2010, 49 (17), pp.3250. ⟨10.1364/AO.49.003250⟩. ⟨hal-02900595⟩
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