Skip to Main content Skip to Navigation
Journal articles

Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators

Document type :
Journal articles
Complete list of metadata

https://hal.univ-lorraine.fr/hal-02900601
Contributor : Laurent Broch Connect in order to contact the contributor
Submitted on : Thursday, July 16, 2020 - 11:34:54 AM
Last modification on : Friday, July 17, 2020 - 3:17:13 AM

Links full text

Identifiers

Collections

Citation

Laurent Broch, Aotmane En Naciri, Luc Johann. Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators. Thin Solid Films, Elsevier, 2011, 519 (9), pp.2601-2603. ⟨10.1016/j.tsf.2010.12.046⟩. ⟨hal-02900601⟩

Share

Metrics

Record views

20