Journal Articles
Thin Solid Films
Year : 2011
LAURENT BROCH : Connect in order to contact the contributor
https://hal.univ-lorraine.fr/hal-02900601
Submitted on : Thursday, July 16, 2020-11:34:54 AM
Last modification on : Friday, July 17, 2020-3:17:13 AM
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Laurent Broch, Aotmane En Naciri, Luc Johann. Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators. Thin Solid Films, 2011, 519 (9), pp.2601-2603. ⟨10.1016/j.tsf.2010.12.046⟩. ⟨hal-02900601⟩
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