Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators - Université de Lorraine Access content directly
Journal Articles Thin Solid Films Year : 2011

Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators

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hal-02900601 , version 1 (16-07-2020)

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Laurent Broch, Aotmane En Naciri, Luc Johann. Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators. Thin Solid Films, 2011, 519 (9), pp.2601-2603. ⟨10.1016/j.tsf.2010.12.046⟩. ⟨hal-02900601⟩
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