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Poster communications

Systematic errors for a Mueller Matrix Ellipsometer

Abstract : We present the influence of systematic errors due to azimuth errors of the optical elements for a MME. This ellipsometer is based on the dual rotating-compensator principle in the PC1SC2A configuration developed by Collins. The first and secondorder systematic errors have been characterized for all elements of the 4×4 normalized Mueller matrix and for the Jones matrix elements tanYpp and Dpp. We show that these errors can be eliminated by a four zone measurement technical.
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Poster communications
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https://hal.univ-lorraine.fr/hal-02900774
Contributor : Laurent Broch <>
Submitted on : Thursday, July 16, 2020 - 2:06:25 PM
Last modification on : Friday, July 17, 2020 - 3:17:12 AM
Long-term archiving on: : Tuesday, December 1, 2020 - 9:02:15 PM

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  • HAL Id : hal-02900774, version 1

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G Piller, L. Broch, L. Johann. Systematic errors for a Mueller Matrix Ellipsometer. 4th International Conference on Spectroscopic Elllliipsometry, Jun 2007, Stockholm, Sweden. ⟨hal-02900774⟩

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