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Poster Communications Year : 2007

Ellipsometric investigations of Bi 2 Te 3 thin films grown by electrodeposition

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hal-02900896 , version 1 (16-07-2020)

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  • HAL Id : hal-02900896 , version 1

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Alexandre Zimmer, Nicolas Stein, Luc Johann, M. Stchakovsky, H Terryn, et al.. Ellipsometric investigations of Bi 2 Te 3 thin films grown by electrodeposition. 4th International Conference on Spectroscopic Ellipsometry, Jun 2007, Stockholm, Sweden. ⟨hal-02900896⟩

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