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Characterization of Ti-Al surface alloy formed by pulsed electron-beam melting of film-substrate system

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https://hal.univ-lorraine.fr/hal-03059575
Contributor : Nathalie Allain <>
Submitted on : Saturday, December 12, 2020 - 6:50:24 PM
Last modification on : Sunday, December 13, 2020 - 3:27:33 AM

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N Allain-Bonasso, V Rotshtein, E. Bouzy, L. Germain, Yu Ivanov, et al.. Characterization of Ti-Al surface alloy formed by pulsed electron-beam melting of film-substrate system. Journal of Physics: Conference Series, IOP Publishing, 2013, 416, pp.012007. ⟨10.1088/1742-6596/416/1/012007⟩. ⟨hal-03059575⟩

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