About finite element modeling of film/substrate systems
Résumé
Various models in the literature can predict the instabilities in film/substrate systems, however only a few of them are based on full standard techniques of computational mechanics. For instance, the use of Fourier spectral method permits fairly low cost computations, but imposes periodic boundary conditions. In this talk we revisit the numerical modeling of film/substrate systems by the finite element method, which allows accounting for various geometries, material properties and boundary conditions. Generally, the substrate is taken to be thick, which prescribes 2D/3D elements, while thin shell elements are more suitable for the film, however 2D/3D elements are necessary in the case of short instability wavelength. The simulation of many wrinkles by finite elements leads to large-scale problems and therefore to High Performance Computing. In this present communication we will revisit this question, furthermore, specific responses due to boundary conditions can be observed by full finite element computations and some examples will be presented.