Atomic Force Microscopy to decipher microbial adhesion - Université de Lorraine
Conference Papers Year : 2018

Atomic Force Microscopy to decipher microbial adhesion

HAL Talk El-Kirat-Chatel Vindeln 2018.pdf (4.06 Mo) Télécharger le fichier
Origin Files produced by the author(s)

Dates and versions

hal-03550679 , version 1 (01-02-2022)

Identifiers

  • HAL Id : hal-03550679 , version 1

Cite

Sofiane El-Kirat-Chatel. Atomic Force Microscopy to decipher microbial adhesion. Workshop STINT “The interface between cells and biomaterials”, Madeleine Ramstedt; STINT Swedish Foundation for International Cooperation in Research and Higher Education, Jul 2018, Vindeln, Sweden. ⟨hal-03550679⟩
22 View
7 Download

Share

More