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Conference papers

CMOS microsystem for AC current measurement with galvanic isolation

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https://hal.univ-lorraine.fr/hal-03567067
Contributor : Philippe Poure Connect in order to contact the contributor
Submitted on : Friday, February 11, 2022 - 7:29:43 PM
Last modification on : Tuesday, February 15, 2022 - 3:43:14 AM

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V. Frick, L. Hebrard, Philippe Poure, F. Anstotz, F. Braun. CMOS microsystem for AC current measurement with galvanic isolation. IEEE SENSORS 2002, 2002, Orlando, United States. pp.1445-1450, ⟨10.1109/ICSENS.2002.1037335⟩. ⟨hal-03567067⟩

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