CMOS microsystem for AC current measurement with galvanic isolation - Université de Lorraine Access content directly
Conference Papers Year : 2002
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hal-03567067 , version 1 (11-02-2022)

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V. Frick, L. Hebrard, Philippe Poure, F. Anstotz, F. Braun. CMOS microsystem for AC current measurement with galvanic isolation. IEEE SENSORS 2002, 2002, Orlando, United States. pp.1445-1450, ⟨10.1109/ICSENS.2002.1037335⟩. ⟨hal-03567067⟩
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