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Analyses quantitatives par SIMS dans le mode secondaire négatif :

Abstract : Secondary Ion Mass Spectrometry presents many advantages like high sensitivity and excellent mass resolution, but also a major deficiency which is the lack of quantification due to the matrix effect: the ionization probability of secondary ions depends on the sample composition such that quantification is only possible for a known surface composition. To overcome this problem the Cation Mass Spectrometer has been developed in our laboratory. This instrument is equipped with a neutral cesium CsÊ evaporator to enable an excellent Cs surface concentration control over the whole range and increase the negative secondary ion ionization probability. In this PhD work, avoiding the matrix effect, respectively increasing the analysis sensitivity are studied by Xy+ bombardment and simultaneous CsÊ deposition on different substrates and for various bombardment conditions. In that way the influence of the Cs surface concentration on negative ion formation can be clarified. What's more, useful yield and electron work function variations with respect to Cs surface concentrations allow to discuss the validity of the electron tunneling model and to compare CsÊ deposition alone (results from literature) to CsÊ deposition with simultaneous ion irradiation (experimental results). The usefulness of the developed technique is shown by several applications
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Submitted on : Thursday, March 29, 2018 - 1:50:06 PM
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  • HAL Id : tel-01752516, version 1



Patrick Philipp. Analyses quantitatives par SIMS dans le mode secondaire négatif :. Autre. Institut National Polytechnique de Lorraine, 2005. Français. ⟨NNT : 2005INPL077N⟩. ⟨tel-01752516⟩



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