A multi-scale modeling framework for instabilities of film/substrate systems - Archive ouverte HAL Access content directly
Journal Articles Journal of the Mechanics and Physics of Solids Year : 2016

A multi-scale modeling framework for instabilities of film/substrate systems

(1, 2) , (2)
1
2

Abstract

Spatial pattern formation in stiff thin films on soft substrates is investigated from a multi-scale point of view based on a technique of slowly varying Fourier coefficients. A general macroscopic modeling framework is developed and then a simplified macroscopic model is derived. The model incorporates Asymptotic Numerical Method (ANM) as a robust path-following technique to trace the post-buckling evolution path and to predict secondary bifurcations. The proposed multi-scale finite element framework allows sinusoidal and square checkerboard patterns as well as their bifurcation portraits to be described from a quantitative standpoint. Moreover, it provides an efficient way to compute large-scale instability problems with a significant reduction of computational cost compared to full models.
Not file

Dates and versions

hal-01515198 , version 1 (27-04-2017)

Identifiers

Cite

Fan Xu, Michel Potier-Ferry. A multi-scale modeling framework for instabilities of film/substrate systems. Journal of the Mechanics and Physics of Solids, 2016, 86, pp.150-172. ⟨10.1016/j.jmps.2015.10.003⟩. ⟨hal-01515198⟩
68 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More