Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensators
Abstract
A dual rotating compensators ellipsometer has been developed. It is based on the optical PC1SC2A configuration, where C1 and C2 are the synchronized continuously rotating compensators [1]. The systematic errors if the compensators are quarter-wave plates have been already studied [2]. Smith [3] has demonstrated that the optimum retardance of a dual-rotating-retarder (DRR) instrument must be equal to 127° compared to the quarter-wave (90°) retarders generally used.
Domains
Physics [physics]| Origin | Files produced by the author(s) |
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