Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD - Université de Lorraine Access content directly
Journal Articles Scripta Materialia Year : 2020

Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD

Abstract

Global Digital Image Correlation (DIC) is applied on the electron diffraction patterns acquired by the “on-axis” Transmission Kikuchi Diffraction (TKD) technique. High-angular resolution (HR-TKD) mappings of the grain internal disorientations and the associated geometrically necessary dislocation densities are then derived at a nanoscale resolution. Tailored for the fine characterization of nanomaterials in the scanning electron microscope (SEM), the method is illustrated on a nanostructured high-purity aluminium processed by severe plastic deformation (SPD) and its performances are discussed in the light of imaging by transmission electron microscopy (TEM) and by SEM using a forescatter electron detector (FSD).
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Dates and versions

hal-03006691 , version 1 (16-11-2020)

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Attribution - NonCommercial - NoDerivatives

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Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin, Emmanuel Bouzy. Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD. Scripta Materialia, 2020, 185, pp.30-35. ⟨10.1016/j.scriptamat.2020.04.005⟩. ⟨hal-03006691⟩
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