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Spherical Indexing of Overlap EBSD Patterns for Orientation-related Phases -Application to Titanium

Abstract : We propose a new electron backscatter diffraction (EBSD) indexing approach that can handle overlapping patterns arising from fine-scale mixtures of two crystallographically distinct but related phases. The approach relies on a combination of spherical indexing (SI) with an overlap master pattern (OMP) in which the two phases have the proper orientation relation. We illustrate the approach using a Ti-10-2-3 sample and compare results from traditional Hough-based indexing of the α and β-phases with SI maps. We show that the SI approach produces superior orientation maps, and we present a symmetry-based algorithm for the determination of the α-phase variant when experimental patterns are indexed with respect to the OMP. We illustrate the use of the OMP to determine the parent β-phase volume fraction and obtain excellent agreement with Thermo-Calc phase fraction predictions.
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Contributor : Nathalie Gey Connect in order to contact the contributor
Submitted on : Thursday, December 3, 2020 - 3:53:26 PM
Last modification on : Wednesday, November 3, 2021 - 8:54:00 AM
Long-term archiving on: : Thursday, March 4, 2021 - 7:29:21 PM


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W Lenthe, L Germain, M Chini, Nathalie Gey, Marc de Graef. Spherical Indexing of Overlap EBSD Patterns for Orientation-related Phases -Application to Titanium. Acta Materialia, Elsevier, 2020, 188, pp.579-590. ⟨10.1016/j.actamat.2020.02.025⟩. ⟨hal-03038686⟩



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