Multi-scale approach for analyzing sub-boundaries induced during dislocational creep of uranium dioxide
Résumé
This study presents an original multiscale approach to characterize and quantify sub-boundaries networks induced in a UO 2 sample, mechanically tested in compression at 1500°C. It consists of taking advantage of three complementary techniques : (1) EBSD (Electron BackScatter Diffraction) to quantify the low and very low angle boundaries with increasing deformation and translate it in Geometrically Necessary Dislocations (2) Accurate-ECCI (Electron Channeling Contrast Imaging) to image and resolve the dislocations arranged in low angle boundaries and finally (3) TEM (Transmission Electron Microscopy) analysis of FIB (Focus Ion Beam) lamellae cut in sub-boundary cross section, previously analyzed by ECCI.
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