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Design and Fabrication of Next-Generation Lanthanum-Doped Lead-free Solder for Reliable Microelectronics Applications in Severe Environment

Abstract : The urgent need for removing lead from solder alloys led to the very fast introduction of lead-free solder alloys without a deep knowledge of their behaviour. As a consequence, additional issues raised (increased thermally induced problems during soldering process, a too wide range of possible available alternative alloy formulations), while problems related to current solder alloys remained unsolved (the constant change of the solder alloy microstructure, empirical predicting lifetime methodology). All the above mentioned issues alter stability and reliability of the application specific performances of the solder alloy, and subsequently of the whole electronic module. These problems become critical and are no longer compatible, as the market goes towards miniaturization and harsh environment conditions. These market trends now require stricter life time prediction and reliability control. Objective of this project is to understand and design a novel lead-free solder formulation to develop a potential alternative to lead-based high temperature melting point solder for high reliability requirements and in accordance with governmental directives. An advanced experimental approach like nanoindentation, microstructure evolution with SEM and EDS mapping, thermal aging effects on continuous grain size growth with cross polarized light of optical microscopy etc. would be implemented to develop doped-SAC lead-free solders for the best-fit to requirements in automotives and pipelines applications
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https://hal.univ-lorraine.fr/tel-01749215
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  • HAL Id : tel-01749215, version 1

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Muhammad Sadiq. Design and Fabrication of Next-Generation Lanthanum-Doped Lead-free Solder for Reliable Microelectronics Applications in Severe Environment. Other. Université de Lorraine, 2012. English. ⟨NNT : 2012LORR0049⟩. ⟨tel-01749215⟩

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