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Numerical study of instability patterns of film-substrate systems

Abstract : Surface wrinkles of stiff thin layers attached on soft materials have been widely observed in nature and these phenomena have raised considerable interests over the last decade. The post-buckling evolution of surface morphological instability often involves strong effects of geometrical nonlinearity, large rotation, large displacement, large deformation, loading path dependence and multiple symmetry-breakings. Due to its notorious difficulty, most nonlinear buckling analyses have resorted to numerical approaches since only a limited number of exact analytical solutions can be obtained. This thesis proposes a whole framework to study the film/substrate buckling problem in a numerical way: from 2D to 3D modeling, from classical to multi-scale perspective. The main aim is to apply advanced numerical methods for multiple-bifurcation analyses to various film/substrate models, especially focusing on post-buckling evolution and surface mode transition. The models incorporate Asymptotic Numerical Method (ANM) as a robust path-following technique and bifurcation indicators well adapted to the ANM to detect a sequence of multiple bifurcations and the associated instability modes on their post-buckling evolution path. The ANM gives interactive access to semi-analytical equilibrium branches, which offers considerable advantage of reliability compared with classical iterative algorithms. Besides, an original nonlocal coupling strategy is developed to bridge classical models and multi-scale models concurrently, where the strengths of each model are fully exploited while their shortcomings are accordingly overcome. Discussion on the transition between different scales is provided in a general way, which can also be seen as a guide for coupling techniques involving other reduced-order models. Lastly, a general macroscopic modeling framework is developed and two specific Fourier-related models are derived from the well-established classical models, which can predict the pattern formation with much fewer elements so as to significantly reduce the computational cost
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Submitted on : Thursday, March 29, 2018 - 1:20:04 PM
Last modification on : Tuesday, October 19, 2021 - 11:46:27 AM


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  • HAL Id : tel-01751474, version 1


Fan Xu. Numerical study of instability patterns of film-substrate systems. Other. Université de Lorraine, 2014. English. ⟨NNT : 2014LORR0309⟩. ⟨tel-01751474⟩



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