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Caractérisation de surfaces organiques moléculaires et polymères par SIMS statique : effet de la métallisation

Abstract : Static SIMS (secondary ion mass spectrometry) is a very powerfull technique, allowing the analysis of the uppermost layers of a sample surface. Monolayers and multilayers of molecular and polymeric organic samples, prepared on metal substrates, are analyzed by static SIMS in order to determine the parameters that are responsible of the formation of main mass spectrum peaks. The influence of the metal substrate, as well as the metallization effect, are studied. On bulk polymers, silver metallization allows an increase of the accessible mass range, and detection of ions arising from cationization of polymer fragments by the metal. Finally, a study of surface oligomers is realized by static SIMS
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https://hal.univ-lorraine.fr/tel-01777148
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Claude Simon. Caractérisation de surfaces organiques moléculaires et polymères par SIMS statique : effet de la métallisation. Autre. Université Paul Verlaine - Metz, 1996. Français. ⟨NNT : 1996METZ039S⟩. ⟨tel-01777148⟩

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