Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps

Abstract : A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a modified Dijkstra algorithm which seeks the continuous set of boundaries having the highest average disorientation angle.
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Article dans une revue
Materials Characterization, Elsevier, 2014, 98, pp.66-72. 〈10.1016/j.matchar.2014.10.007〉
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https://hal.univ-lorraine.fr/hal-01503888
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Soumis le : vendredi 7 avril 2017 - 17:16:53
Dernière modification le : mercredi 12 septembre 2018 - 01:27:49

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Lionel Germain, D. Kratsch, M. Salib, Nathalie Gey. Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps. Materials Characterization, Elsevier, 2014, 98, pp.66-72. 〈10.1016/j.matchar.2014.10.007〉. 〈hal-01503888〉

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