A multi-scale modeling framework for instabilities of film/substrate systems

Abstract : Spatial pattern formation in stiff thin films on soft substrates is investigated from a multi-scale point of view based on a technique of slowly varying Fourier coefficients. A general macroscopic modeling framework is developed and then a simplified macroscopic model is derived. The model incorporates Asymptotic Numerical Method (ANM) as a robust path-following technique to trace the post-buckling evolution path and to predict secondary bifurcations. The proposed multi-scale finite element framework allows sinusoidal and square checkerboard patterns as well as their bifurcation portraits to be described from a quantitative standpoint. Moreover, it provides an efficient way to compute large-scale instability problems with a significant reduction of computational cost compared to full models.
Type de document :
Communication dans un congrès
3rd ECCOMAS Young Investigators Conference (YIC) & 6th GACM Colloquium on Computational Mechanics, Jul 2015, Aix-la-Chapelle, Germany. PERGAMON-ELSEVIER SCIENCE LTD, Journal of the Mechanics and Physics of Solids, 86, pp.150-172
Domaine :
Liste complète des métadonnées

Littérature citée [21 références]  Voir  Masquer  Télécharger

https://hal.univ-lorraine.fr/hal-01512998
Contributeur : Lem3 Ul <>
Soumis le : jeudi 27 avril 2017 - 09:11:45
Dernière modification le : mercredi 12 septembre 2018 - 01:27:06

Identifiants

  • HAL Id : hal-01512998, version 1

Collections

Citation

Fan Xu, Michel Potier-Ferry. A multi-scale modeling framework for instabilities of film/substrate systems. 3rd ECCOMAS Young Investigators Conference (YIC) & 6th GACM Colloquium on Computational Mechanics, Jul 2015, Aix-la-Chapelle, Germany. PERGAMON-ELSEVIER SCIENCE LTD, Journal of the Mechanics and Physics of Solids, 86, pp.150-172. 〈hal-01512998〉

Partager

Métriques

Consultations de la notice

60