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Extensions of electron diffraction based techniques in crystallographic characterization

Abstract : With the advance of electron diffraction techniques in individual orientation analysis, traditional crystallographic characterization methods could be simplified, thus offering chances to develop some new approaches. In recent years, our group has devoted to working on possible extensions of the SEM and TEM based techniques for crystallographic analyses on a microstructure- and orientation-specific level. Several methods are illustrated in this paper, including the determination of dislocation type and Burgers vector without recourse to the traditional g.b invisibility condition, the identification of twinning mode and complete twinning elements for any crystal symmetry that requires minimum initial data input, and the characterization of specific interface plane or slip plane using only one sample observation plane instead of two perpendicular sample planes. These new extensions of characterization methods have proven to facilitate the related microstructural examinations.
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Liang Zuo, Zongbin Li, Yudong Zhang, Claude Esling, Xiang Zhao. Extensions of electron diffraction based techniques in crystallographic characterization. 5th International Conference on Recrystallization & Grain Growth (ReXGG), May 2013, Sydney, Australia. pp. 11-16, ⟨10.4028/⟩. ⟨hal-01517705⟩



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