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Electron channeling contrast imaging : influence of diffraction conditions on dislocation contrast

Abstract : Electron Channeling Contrast Imaging (ECCI) is a nondestructive diffraction-based SEM technique that allows direct observation and comprehensive characterization of crystalline defects in the near-surface (≈ 150 nm) region of bulk materials [1-3]. This technique takes advantage from the strong dependence between the backscattered electron yields and the crystal orientation relative to the incident electron beam.Dislocations for example can be characterized by ECCI using the well-known transmission electron microscopy g•b=0 and g•bxu=0 extinction criteria [4] where g is the diffraction vector and b the Burgers vector. In this study, fundamental and experimental aspects of electron diffraction for characterizing dislocation by ECCI in SEM are reported. The (+g,-g) method is explored on several dislocation configurations in an Interstitial-Free steel sample. Moreover the first detailed characterization of a dislocation dipole by ECCI [5] is presented.References[1] Morin. P., Pitaval. M., Besnard. D. and Fontaine. G. Electron–channelling imaging in scanning electron microscopy. Philos. Mag. 40:4, 511-524.[2] Mansour, H., Guyon, J., Crimp, M.A., Gey, N., Beausira, B., Maloufi, N. Scripta. Mater. 84–85 (2014) 11–14.[3] Mansour, H., Crimp, M.A., Gey, N., Maloufi, N. Scripta. Mater. 109 (2015) 76–79.[4] Crimp, M. A., Simkin, B. A., Ng, B. C. Demonstration of the g·(b x u) = 0 edge dislocation invisibility criterion for electron channeling contrast imaging. Philos. Mag. 81 (2001) 833-837.[5] Kriaa, H., Guitton, A., Maloufi, N. Submission in progress.
Keywords : Dislocation ECCI
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https://hal.univ-lorraine.fr/hal-03043041
Contributor : Antoine Guitton <>
Submitted on : Monday, December 7, 2020 - 9:59:38 AM
Last modification on : Friday, February 26, 2021 - 2:48:03 PM

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  • HAL Id : hal-03043041, version 1

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Hana Kriaa, Antoine Guitton, Nabila Maloufi. Electron channeling contrast imaging : influence of diffraction conditions on dislocation contrast. SF2M, 2017, Lyon, France. ⟨hal-03043041⟩

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